Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Digital Classical Shock Controller
DVC-4/8 Shock
The CSC- I will perform all of the 'classical' shock tests as defined in MIL-STD-810 and is equally useful for environmental qual testing or production test screening. Automatic calculation of pre- and post-pulse compensation assures the maximum performance from your test system.
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PXI 10W Programmable Resistor Module, 1-Channel, 1.5Ω to 1.81kΩ
40-253-022
The 40-253-022 is a programmable resistor module with 1 channel which can be set between 1.5Ω and 1.81kΩ with 0.5Ω resolution The 40-253 range provides a simple solution for applications requiring up to 10W of power handling per channel. The 40-253 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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3D Camera
The ARAMIS 3D Camera is a measuring system for full-field and point-based measurements. With a high resolution of 6 megapixels and a maximum image recording rate of 25 Hz at full resolution, the sensor is suited for medium-fast applications in the field materials and components testing. In a different configuration with a resolution of 2.3 megapixels and a maximum image recording rate of 130 Hz at full resolution expands the range of applications. The ARAMIS 3D Camera is employed in general research and industrial applications for measurements of small specimens up to large objects.
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SIP-90-2 Test System Interface Probe
SIP-90-2
Overall Length (mil): 700Overall Length (mm): 17.78Rec. Mounting Hole Size (mil): 55Rec. Mounting Hole Size (mm): 1.40Recommended Drill Size: #54 or 1.40 mm
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Power Electronics Test Bench
OP1300
The multi-purpose and ready-to-use Power Electronics Test Bench combines a state-of-the-art Hardware-in-the-Loop (HIL) simulator from OPAL-RT with Imperix’s Rapid Control Prototyping (RCP) system and real power hardware. It enables rapid development of power electronics, drives and smart-grid applications across industry and academia.
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Test System
LB301
Computer Gesteuerte Systeme GmbH
The system is pin and software compatible to the larger test systems LB302 / 303. Due to the fewer needed I/Os, the tester features the compact G6 receiver (Virginia Panel Cooperation) compared to the larger G12 of the other tester versions. The LB301 is equipped with a 2kW power supply and can control one load box.
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Configurable Microwave and Optical Witching Platform
1257
The Astronics 1257 switching system is a high-performance switching and control system available in 4U, 5U, or 6U rack-mountable packages. The unit draws upon our four decades of experience as a major automated test equipment (ATE) switching supplier to set a new standard in switching systems.
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Maintenance & Maintenance-/Service Contract
With cars it is easy: Change of oil, check of breaks and V-belt .. etc. - that is normal. But your test system does not need all these things. However it makes sense to look after your test system occasionally and check or change special idems. If you take the time and plan a preventive maintenance your test system will have less unplanned failure times. Less dust means less heat and slower ageing of electronic components.
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Error Distribution Analysis Package For M8000 Series BER Test Solutions
M8070EDAB
The M8070B system software for the M8000 Series of BER Test Solutions can be enhanced by additional software packages, such as M8070ADVB or M8070EDAB to get the best out of the M8040A, M8020A and M8030A J-BERT platforms.The M8070EDAB Error Distribution Analysis package offers features like burst mechanism detection and analysis, frame loss ratio estimation and error mapping.For instance, you can easily estimate your FEC decoder margin or find the root cause of systematic errors by exploring the error map. The plugin also supports the use of real-time scopes as error detector.
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Infiniium S-Series High-Definition Oscilloscope: 2.5 GHz, 4 Analog Channels
DSOS254A
2.5 GHz bandwidth (upgradable)4 analog channels Capture a longer signal trace with 20 GSa/s max sample rate and 100 Mpts/channel of standard memory Get superior signal integrity with system ENOB of 7.4 bits and 10-bit analog-to-digital converter (ADC)Gain increased usability with the multi-touch supported 15 inch capacitive touch screen and solid state drive for fast boot and reliability Improve your testing with a wide range of protocol, compliance, and analysis software
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Burn-in System
Sonoma
High power burn-in system with advanced testing functionality at DUT level for substantially lower cost and high performance using State-of-the-Art technology
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Smart Card Testers
CT1000
The CT1000 testers are open and configurable to test any kind of communication protocols used on smart cards, and to be updated for new technologies. The systems can test devices that use common standard protocols (as ISO 18000, EPC Global Gen 2, ISO 14443, ISO 15693, MIFARE™, DESFIRE™, FeliCa™, ISO 11784/85, ICode™, Hitag™, ISO 7816, ISO 7813), and are ready to test also the next generation of cards protocols, such as: USB-Keys, MMC, Micro-SD (with and without CPU inside), M-SIM, HD-SIM, SIM-WAVE, and I2C.
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Full-Featured Life Cycle Test System
LCV
Configurations for testing to industry standards: IEC, SAE, BCILife Cycle Testing: Perform charge/discharge cycling of batteries or modules to obtain charge and discharge capacity, energy and DC internal resistanceAutomotive Battery TestingStarting, Lighting and Ignition (SLI) TestingTraction Battery Testing
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LTE RF Communication Subsystem
The Delaire USA LTE RF Communication Subsystem is designed to provide a versatile solution for the testing needs of the next generation wireless systems. With the LTE test subsystem developers can build an end-to-end test environment for complete system operation. From end user equipment and eNodeB base stations to full system functionality, the LTE RF Communication subsystem allows developers to test and evaluate equipment and system performance in a controlled laboratory environment.
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Intelligent, Single- or Dual-Channel MIL-STD-1760 Adapter
EXC-1553UNET/Px-1760
The EXC-1553UNET/Px-1760 is an intelligent, single- or dual-channel, MIL-STD-1760 adapter. Its small size and ability to interface through USB or Ethernet interfaces make it a complete solution for developing, testing and performing system simulation of the MIL-STD-1760 bus, both in the lab and in the field.The EXC-1553UNET/Px-1760 shares its API with the entire Px family so that applications currently running on PCI, PCIe, ExCARD or PCMCIA boards will run without change on this device.Multiple ...show more -
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Dropout, Surge, Ripple Simulator and AC/DC Voltage Source
DSR 100 Series
DSR 100 Series systems provide complete, single-box solutions for immunity testing. They include a simple-to-use yet powerful standards waveform generator matched with an industry leading power supply technology and come with an extensive library of tests for many automotive and aviation standards.
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PXI High Density Precision Resistor Module, 9-Channel, 3Ω to 52.4kΩ
40-298-033
The 40-298-033 is a high density programmable resistor module with 9 channels which can be set between 3Ω and 52.4kΩ with 1Ω resolution The 40-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Computer On Module
COMET6-DEVKIT-460-I7
The COMET6-DEVKIT-460-I7 is designed for rapid testing and evaluation of WINSYSTEMS’ COM Express Type 6 processor modules. This DevKit ships with WINSYSTEMS’ COMET6-1185GRE-32IL module and 11th Gen Intel® CORE™ i7 UP3-Class embedded processor. The DevKit includes all essential components for quick and easy system setup so you can start programming right out of the box, reduce engineering and software development time, perform rapid product evaluation, design validation, and speed time to market.
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Analogue IC Tester
SYSTEM 8 (AICT)
The SYSTEM 8 Analogue IC Tester is the answer to testing analogue devices. The key feature of the AICT is its ability to functionally test all common analogue ICs and discrete devices in circuit. It is also capable of testing all types of analogue and digital components by means of the well-known, power off V-I test technique. For users requiring only the latter function, please select the Analogue Test Station section.
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Solar Analyzers
Max. solar system power (Pmax) search by Auto-scan: 1000V, 12A (12000W capability)The analyzer and the Remote Solar Detector is connected by Bluetooth wireless communication (Bluetooth 2.1 + EDR Class 1)The Remote Solar Detector is moisture-proofIntelligent test logic with no personnel attendance required in the field Solar system analyzer waits and tests the system until appropriate sunlight irradiance is detectedMax. voltage (Vpm) at Pmax, Max. current (Ipm) at Pmax Voltage at open circuit (Vo...show more -
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Voltmeters
ARC Flash No Volts Meter is an ultra-safe portable digital voltmeter. It can provide testing of voltage on firing and related system lines. The 620EXV is certified to meet USA MIL. STD. 810 MTD. 511, therefore compliant for use in explosive atmospheres. This product will accurately inform its operator using red and green lights (which can be set to custom levels) to indicate whether or not the voltage level conforms.
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4-Slot USB/LXI Modular Chassis
60-105-001
This 4-slot USB/LXI modular chassis offers a small lightweight form factor, making it ideal for portable, benchtop, and space restrictive applications. The chassis is designed for desk or rack mounting and features remote control via USB or LXI Ethernet. Remote control over a network enables the switching function of a test system to be located as close as possible to the target equipment.
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High Efficiency, Low-Cost Test for Less Complex Signal Devices
J750Ex-HD Family
Microcontroller Units (MCUs) are used in automobiles, mobile electronics and robotics. As you go through your day, dozens of MCUs are in your electronic devices working to provide unique features and Teradyne’s J750 family most likely tested them. With a growing installed base of over 6,000 test systems and widely available at more than 50 Outsourced Assembly and Test (OSAT) locations, Teradyne’s J750 is the industry standard for high volume test of low-cost devices.
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Waveguide Harmonic Mixers (smart mixer), 50 to 75/80 GHz
M1970V
The Keysight M1970V 50 to 75/80 GHz waveguide harmonic mixer is an un-preselected mixer that will extend the operating frequency range of the N9030A PXA, N9020A MXA, and N9010A EXAsignal analyzers up to 80 GHz. Smart features are embedded to help you to greatly simplify your overall test setup and improve your DANL and TOI of your test system. Go smart with harmonic mixing for your millimeter-wave applications.
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Missile Warning System Test Set
Baringa™ IR/UV
Baringa™ is a handheld, ruggedized aircraft survivability test set used to stimulate the electro-optic sensor suites on various aircraft platforms. Available in ultraviolet (UV) as well as one-color or two-color infrared (IR), Baringa simulates dynamic multi-engagement profiles and is easily reprogrammable to meet user testing needs.
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Large Electrical Machines Bench Testing
The automated system for recording parameters during testing of gas turbine generators consists of several independent but interacting measuring subsystems and a signal conditioning system. The subsystems for recording "fast" signals are implemented on the PXI platform, "slow" signals are registered by a subsystem built on the basis of the Compact FieldPoint platform.
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USB⇔RS-232C
SI-55USB
SI-55USB is an USB converter, which converts USB of PC into RS-232C serial port of signal-isolated type. Virtual COM port driver ease the usage of test software and shorten the time of installing the new system. Features of this product are max 1Mbps baud rate and 3000V high-voltage resistant isolation by photo coupler and isolated power unit.
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Load Testing Services
If you're looking for load testing services, you're probably investing heavily in advertising campaigns. But unless you run load tests to ensure your system works properly under real-life load conditions, you can lose both your marketing dollars and potential sales. With UTOR you get the confidence that your application will not damage your business.
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PXIe-5451, 145 MHz, 16-Bit, 128 MB, PXI Waveform Generator
781204-01
PXIe, 145 MHz, 16-Bit, 128 MB, PXI Waveform Generator—The PXIe‑5451 is a 145 MHz, dual‐channel arbitrary waveform generator capable of generating user-definied waveforms, standard functions, and I/Q communications signals. It is an ideal instrument for including in systems for testing devices with I/Q inputs, or as the baseband component of an RF vector signal generator as wells as time-domain signals like envelope tracking. The PXIe‑5451 also features onboard signal processing (OSP) functions t...show more -
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PCI Programmable Resistor Card 2-Channel 2.5 Ohm To 8.19k Ohm
50-294-024
The 50-294 series of PCI Programmable Resistor cards are available with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single card. These cards are ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
